Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements
Küçük Resim Yok
Tarih
2022
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
IEEE-Inst Electrical Electronics Engineers Inc
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
A new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibrationfree and calibration-dependent methods in the literature.
Açıklama
Anahtar Kelimeler
Complex permittivity, deembedding technique, free-space, gating, uncalibrated measurements
Kaynak
Ieee Transactions On Instrumentation and Measurement
WoS Q Değeri
Q1
Scopus Q Değeri
Q1
Cilt
71
