Improved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurements

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dc.authoridIzginli, Mucahit/0000-0001-8468-1568
dc.authoridHasar, Ugur Cem/0000-0002-6098-7762
dc.authoridBarroso, Joaquim J/0000-0002-6635-6638
dc.authoridRamahi, Omar/0000-0002-9403-0029
dc.authoridKaya, Yunus/0000-0002-2380-5915
dc.contributor.authorHasar, Ugur Cem
dc.contributor.authorKaya, Yunus
dc.contributor.authorOzturk, Hamdullah
dc.contributor.authorIzginli, Mucahit
dc.contributor.authorErtugrul, Mehmet
dc.contributor.authorBarroso, Joaquim Jose
dc.contributor.authorRamahi, Omar M.
dc.date.accessioned2024-10-04T18:51:06Z
dc.date.available2024-10-04T18:51:06Z
dc.date.issued2022
dc.departmentBayburt Üniversitesien_US
dc.description.abstractA new deembedding technique is proposed for relative complex permittivity epsilon(r) determination of dielectric materials using gated free-space measurements. Its three main features are 1) it does not require any formal calibration procedure (calibration-free); 2) it is position-insensitive; and 3) it extracts ripple-free epsilon(r) due to gating process. The objective function derived to determine epsilon(r) by the proposed method is validated by free-space measurements of three dielectric samples (polypropylene, polyethylene, and polyoxymethylene). Besides, the accuracy of our method is compared with the accuracy of other calibrationfree and calibration-dependent methods in the literature.en_US
dc.identifier.doi10.1109/TIM.2022.3153991
dc.identifier.issn0018-9456
dc.identifier.issn1557-9662
dc.identifier.scopus2-s2.0-85125330581en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.urihttps://doi.org/10.1109/TIM.2022.3153991
dc.identifier.urihttp://hdl.handle.net/20.500.12403/3388
dc.identifier.volume71en_US
dc.identifier.wosWOS:000770592900011en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherIEEE-Inst Electrical Electronics Engineers Incen_US
dc.relation.ispartofIeee Transactions On Instrumentation and Measurementen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectComplex permittivityen_US
dc.subjectdeembedding techniqueen_US
dc.subjectfree-spaceen_US
dc.subjectgatingen_US
dc.subjectuncalibrated measurementsen_US
dc.titleImproved Method for Permittivity Determination of Dielectric Samples by Free-Space Measurementsen_US
dc.typeArticleen_US

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