Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements
Küçük Resim Yok
Tarih
2021
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
IEEE-Inst Electrical Electronics Engineers Inc
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
A microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air- and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.
Açıklama
Anahtar Kelimeler
Complex permeability, complex permittivity, known substrate, noniterative, reflection-only
Kaynak
Ieee Microwave and Wireless Components Letters
WoS Q Değeri
Q2
Scopus Q Değeri
Q1
Cilt
31
Sayı
3
