Parameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurements

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dc.authoridHasar, Ugur Cem/0000-0002-6098-7762
dc.authoridIzginli, Mucahit/0000-0001-8468-1568
dc.authoridKaya, Yunus/0000-0002-2380-5915
dc.contributor.authorHasar, Ugur Cem
dc.contributor.authorOzturk, Hamdullah
dc.contributor.authorKaya, Yunus
dc.contributor.authorIzginli, Mucahit
dc.contributor.authorErtugrul, Mehmet
dc.date.accessioned2024-10-04T18:52:36Z
dc.date.available2024-10-04T18:52:36Z
dc.date.issued2021
dc.departmentBayburt Üniversitesien_US
dc.description.abstractA microwave method has been proposed for constitutive parameters' extraction of samples on a known substrate. The advantage of this method is that it relies on noniterative reflection-only (air- and metal-backed) scattering (S-) parameters so that it is a good candidate for the characterization of samples when only one-port measurements are available. It is validated by the X-band (8.2-12.4 GHz) waveguide S-parameter measurements. A sensitivity analysis is followed to evaluate and improve the performance of our method.en_US
dc.identifier.doi10.1109/LMWC.2020.3046697
dc.identifier.endpage323en_US
dc.identifier.issn1531-1309
dc.identifier.issn1558-1764
dc.identifier.issue3en_US
dc.identifier.scopus2-s2.0-85099534466en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage320en_US
dc.identifier.urihttps://doi.org/10.1109/LMWC.2020.3046697
dc.identifier.urihttp://hdl.handle.net/20.500.12403/3578
dc.identifier.volume31en_US
dc.identifier.wosWOS:000629021700024en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherIEEE-Inst Electrical Electronics Engineers Incen_US
dc.relation.ispartofIeee Microwave and Wireless Components Lettersen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectComplex permeabilityen_US
dc.subjectcomplex permittivityen_US
dc.subjectknown substrateen_US
dc.subjectnoniterativeen_US
dc.subjectreflection-onlyen_US
dc.titleParameter Retrieval of Samples on a Substrate From Reflection-Only Waveguide Measurementsen_US
dc.typeArticleen_US

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