Comparisons of surface and optical properties of the heavily carbon-doped GaN nanocrystalline films deposited by thermionic vacuum arc method
Küçük Resim Yok
Tarih
2016
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Elsevier Ltd
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
In this paper, heavily C-doped GaN samples were deposited on glass and PET substrates by the thermionic vacuum arc (TVA) method, for the first time. Microstructure, surface and optical properties of the carbon-doped GaN samples were investigated by X-ray diffraction (XRD), field emission scanning electron microscopy, atomic force microscopy, and UV–Vis spectrophotometer. According to XRD pattern, fullerene (C60) structures were able to deposit in doped samples, for the first time. The fullerene structures were detected at heavily carbon-doped GaN. The obtained band gap changes of heavily carbon-doped GaN samples are determined. The band gap of CGaN on PET substrate decreased to a lower value, about 100 meV. The band gaps were shifted to the lowest wavelengths towards the edge of the UV region by heavily doped carbon. (002) and (004) peaks for GaN were also detected. © 2016 Elsevier Ltd
Açıklama
Anahtar Kelimeler
C60-doped GaN, Doped GaN, Optical properties, Surface properties, Atomic force microscopy, Carbon films, Energy gap, Field emission microscopes, Fullerenes, Gallium nitride, Nanocrystals, Scanning electron microscopy, Substrates, Surface properties, Vacuum applications, Vacuum technology, X ray diffraction, Doped GaN, Field emission scanning electron microscopy, Fullerene structure, Heavily doped, Nano-crystalline films, PET substrate, Thermionic vacuum arc methods, XRD patterns, Optical properties, C60-doped GaN, Doped GaN, Optical properties, Surface properties, Atomic force microscopy, Carbon films, Energy gap, Field emission microscopes, Fullerenes, Gallium nitride, Nanocrystals, Scanning electron microscopy, Substrates, Surface properties, Vacuum applications, Vacuum technology, X ray diffraction, Doped GaN, Field emission scanning electron microscopy, Fullerene structure, Heavily doped, Nano-crystalline films, PET substrate, Thermionic vacuum arc methods, XRD patterns, Optical properties
Kaynak
Vacuum
WoS Q Değeri
Q3
Scopus Q Değeri
Q1
Cilt
133
