The substrate effect on Ge doped GaN thin films coated by thermionic vacuum arc

Küçük Resim Yok

Tarih

2017

Dergi Başlığı

Dergi ISSN

Cilt Başlığı

Yayıncı

Springer New York LLC

Erişim Hakkı

info:eu-repo/semantics/closedAccess

Özet

This study focuses on characterization and understanding of the substrate effect on Ge doped GaN thin films coated onto transparent substrates. The produced films were deposited onto unheated glass and unheated polyethylene terephthalate by using thermionic vacuum arc technique. Gallium nitride and germanium pellets were used in the thin film production. Reflectance, refractive index and thicknesses of Ge doped GaN thin films were measured by optical interferometer using Cauchy model for fitting. The transmittances were determined in the wavelength range between 200 and 1000 nm by using UV–Vis double beam spectrophotometer. The optical Tauc method was used to determine the band gap energies of produced thin films. Surface morphologies of produced thin films were characterized by atomic force microscopy and also field emission scanning electron microscopy. In conclusion, the substrate effect on the optical and morphological properties of the produced thin films was observed. © 2016, Springer Science+Business Media New York.

Açıklama

Anahtar Kelimeler

Atomic force microscopy, Energy gap, Field emission microscopes, Gallium nitride, Germanium, Optical films, Plastic bottles, Refractive index, Scanning electron microscopy, Substrates, Vacuum applications, Vacuum technology, Field emission scanning electron microscopy, Film production, Morphological properties, Optical interferometer, Substrate effects, Thermionic vacuum arc, Transparent substrate, Wavelength ranges, Thin films, Atomic force microscopy, Energy gap, Field emission microscopes, Gallium nitride, Germanium, Optical films, Plastic bottles, Refractive index, Scanning electron microscopy, Substrates, Vacuum applications, Vacuum technology, Field emission scanning electron microscopy, Film production, Morphological properties, Optical interferometer, Substrate effects, Thermionic vacuum arc, Transparent substrate, Wavelength ranges, Thin films

Kaynak

Journal of Materials Science: Materials in Electronics

WoS Q Değeri

Q2

Scopus Q Değeri

Q2

Cilt

28

Sayı

2

Künye