The substrate effect on Ge doped GaN thin films coated by thermionic vacuum arc
Küçük Resim Yok
Tarih
2017
Yazarlar
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
Springer New York LLC
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
This study focuses on characterization and understanding of the substrate effect on Ge doped GaN thin films coated onto transparent substrates. The produced films were deposited onto unheated glass and unheated polyethylene terephthalate by using thermionic vacuum arc technique. Gallium nitride and germanium pellets were used in the thin film production. Reflectance, refractive index and thicknesses of Ge doped GaN thin films were measured by optical interferometer using Cauchy model for fitting. The transmittances were determined in the wavelength range between 200 and 1000 nm by using UV–Vis double beam spectrophotometer. The optical Tauc method was used to determine the band gap energies of produced thin films. Surface morphologies of produced thin films were characterized by atomic force microscopy and also field emission scanning electron microscopy. In conclusion, the substrate effect on the optical and morphological properties of the produced thin films was observed. © 2016, Springer Science+Business Media New York.
Açıklama
Anahtar Kelimeler
Atomic force microscopy, Energy gap, Field emission microscopes, Gallium nitride, Germanium, Optical films, Plastic bottles, Refractive index, Scanning electron microscopy, Substrates, Vacuum applications, Vacuum technology, Field emission scanning electron microscopy, Film production, Morphological properties, Optical interferometer, Substrate effects, Thermionic vacuum arc, Transparent substrate, Wavelength ranges, Thin films, Atomic force microscopy, Energy gap, Field emission microscopes, Gallium nitride, Germanium, Optical films, Plastic bottles, Refractive index, Scanning electron microscopy, Substrates, Vacuum applications, Vacuum technology, Field emission scanning electron microscopy, Film production, Morphological properties, Optical interferometer, Substrate effects, Thermionic vacuum arc, Transparent substrate, Wavelength ranges, Thin films
Kaynak
Journal of Materials Science: Materials in Electronics
WoS Q Değeri
Q2
Scopus Q Değeri
Q2
Cilt
28
Sayı
2
