Investigation of the surface free energy of the ITO thin films deposited under different working pressure

Küçük Resim Yok

Tarih

2016

Dergi Başlığı

Dergi ISSN

Cilt Başlığı

Yayıncı

American Institute of Physics Inc.

Erişim Hakkı

info:eu-repo/semantics/closedAccess

Özet

This study discusses the influence of working pressure on the surface energy of the ITO thin films produced by radio frequency magnetron sputtering method. Optical tensiometer (Attension Theta Lite) is used for evaluating wetting behavior of the water droplet on the film surface and Equation of State method was selected to determine surface free energy for this study. Equation of state method does not divide the surface tension into different components such as polar, dispersive, acid-base. It is calculated the surfaces' free energy measuring the contact angle with a single liquid. The surface free energy value was in the range of 15-31 mN/m. Also, the transmittances were determined in the wavelength range between 200 and 1000 nm using the UNICO 4802 UV-Vis double beam spectrophotometer. Transmittances of the produced ITO thin films are greater than %70 in the visible range. © 2016 AIP Publishing LLC.

Açıklama

9th International Physics Conference of the Balkan Physical Union, BPU 2015

Anahtar Kelimeler

Kaynak

AIP Conference Proceedings

WoS Q Değeri

N/A

Scopus Q Değeri

N/A

Cilt

1722

Sayı

Künye