Investigation of the surface free energy of the ITO thin films deposited under different working pressure

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dc.authorid55897767500
dc.authorid55897416100
dc.authorid9274843500
dc.authorid7003415405
dc.contributor.authorÖzen S.
dc.contributor.authorŞenay V.
dc.contributor.authorPat S.
dc.contributor.authorKorkmaz Ş.
dc.date.accessioned20.04.201910:49:12
dc.date.accessioned2019-04-20T21:43:38Z
dc.date.available20.04.201910:49:12
dc.date.available2019-04-20T21:43:38Z
dc.date.issued2016
dc.departmentBayburt Üniversitesien_US
dc.description9th International Physics Conference of the Balkan Physical Union, BPU 2015
dc.description.abstractThis study discusses the influence of working pressure on the surface energy of the ITO thin films produced by radio frequency magnetron sputtering method. Optical tensiometer (Attension Theta Lite) is used for evaluating wetting behavior of the water droplet on the film surface and Equation of State method was selected to determine surface free energy for this study. Equation of state method does not divide the surface tension into different components such as polar, dispersive, acid-base. It is calculated the surfaces' free energy measuring the contact angle with a single liquid. The surface free energy value was in the range of 15-31 mN/m. Also, the transmittances were determined in the wavelength range between 200 and 1000 nm using the UNICO 4802 UV-Vis double beam spectrophotometer. Transmittances of the produced ITO thin films are greater than %70 in the visible range. © 2016 AIP Publishing LLC.en_US
dc.identifier.doi10.1063/1.4944296
dc.identifier.isbn9.78074E+12
dc.identifier.issn0094-243X
dc.identifier.scopus2-s2.0-84984540737en_US
dc.identifier.scopusqualityN/Aen_US
dc.identifier.urihttps://dx.doi.org/10.1063/1.4944296
dc.identifier.urihttps://hdl.handle.net/20.500.12403/628
dc.identifier.volume1722
dc.identifier.wosWOS:000375923300177en_US
dc.identifier.wosqualityN/Aen_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherAmerican Institute of Physics Inc.
dc.relation.ispartofAIP Conference Proceedingsen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleInvestigation of the surface free energy of the ITO thin films deposited under different working pressureen_US
dc.typeConference Objecten_US

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