Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements
Küçük Resim Yok
Tarih
2022
Dergi Başlığı
Dergi ISSN
Cilt Başlığı
Yayıncı
IEEE-Inst Electrical Electronics Engineers Inc
Erişim Hakkı
info:eu-repo/semantics/closedAccess
Özet
A free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transforming frequency-domain measurements into time-domain ones to extract epsilon r, sigma e, and d of polypropylene, polyethylene, and polyoxymethylene samples.
Açıklama
Anahtar Kelimeler
Time-domain analysis, Antenna measurements, Transmission line measurements, Permittivity measurement, Thickness measurement, Temperature measurement, Broadband antennas, Complex permittivity, free-space, metal-backed, reflection-only, thickness, time-domain
Kaynak
Ieee Transactions On Geoscience and Remote Sensing
WoS Q Değeri
Q1
Scopus Q Değeri
Q1
Cilt
60
