Complex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurements

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dc.authoridHasar, Ugur Cem/0000-0002-6098-7762
dc.authoridIzginli, Mucahit/0000-0001-8468-1568
dc.authoridKaya, Yunus/0000-0002-2380-5915
dc.authoridRamahi, Omar/0000-0002-9403-0029
dc.authoridBarroso, Joaquim J/0000-0002-6635-6638
dc.contributor.authorHasar, Ugur Cem
dc.contributor.authorKaya, Yunus
dc.contributor.authorOzturk, Hamdullah
dc.contributor.authorIzginli, Mucahit
dc.contributor.authorBarroso, Joaquim Jose
dc.contributor.authorRamahi, Omar M.
dc.contributor.authorErtugrul, Mehmet
dc.date.accessioned2024-10-04T18:49:24Z
dc.date.available2024-10-04T18:49:24Z
dc.date.issued2022
dc.departmentBayburt Üniversitesien_US
dc.description.abstractA free-space time-domain method is proposed to retrieve dielectric constant (epsilon r), conductivity (sigma e), and thickness (d) of metal-backed low-loss dielectric samples using calibration-independent reflected power peak measurements. Its algorithm is validated by numerical calculations and simulations (CST Microwave Studio) using a sine-modulated Gaussian window. A sensitivity analysis is followed to examine its performance considering the dependencies of reflected power peaks with respect to epsilon r and sigma e. Free-space time-domain measurements have been implemented after transforming frequency-domain measurements into time-domain ones to extract epsilon r, sigma e, and d of polypropylene, polyethylene, and polyoxymethylene samples.en_US
dc.identifier.doi10.1109/TGRS.2021.3090712
dc.identifier.issn0196-2892
dc.identifier.issn1558-0644
dc.identifier.scopus2-s2.0-85107805351en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.urihttps://doi.org/10.1109/TGRS.2021.3090712
dc.identifier.urihttp://hdl.handle.net/20.500.12403/3114
dc.identifier.volume60en_US
dc.identifier.wosWOS:000732803800001en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherIEEE-Inst Electrical Electronics Engineers Incen_US
dc.relation.ispartofIeee Transactions On Geoscience and Remote Sensingen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectTime-domain analysisen_US
dc.subjectAntenna measurementsen_US
dc.subjectTransmission line measurementsen_US
dc.subjectPermittivity measurementen_US
dc.subjectThickness measurementen_US
dc.subjectTemperature measurementen_US
dc.subjectBroadband antennasen_US
dc.subjectComplex permittivityen_US
dc.subjectfree-spaceen_US
dc.subjectmetal-backeden_US
dc.subjectreflection-onlyen_US
dc.subjectthicknessen_US
dc.subjecttime-domainen_US
dc.titleComplex Permittivity and Thickness Evaluation of Low-Loss Dielectrics From Uncalibrated Free-Space Time-Domain Measurementsen_US
dc.typeArticleen_US

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